Name: Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Herkunftsort:

China

Markenname:

WINNER

Zertifizierung:

ISO9100

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Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Produktdetails

Produktname:

Probe für die Federprüfung

Fass:

PB, vergoldet

Unterer Kolben:

BeCu/SK4, vergoldet

TOP-Kolben:

SK4 (Be Cu)/vergoldet

FRÜHLING:

SWPB(SUS)/vergoldet

Verfügbarkeit:

Benutzerdefinierte Größen verfügbar

Beschichtung:

Vergoldet

Aktuelle Bewertung:

Kontaktwiderstand:

100 Mohm max

Bandbreite:

-0,85 dB bei 19,6 GHz

Induktivität:

1,27 nH

Kapitän:

1,62 pF

Voller Hub:

1,0 mm

Nennschlag:

0,65 mm

Federkraft:

25 Gramm bei 0,65 mm

Mechanische Lebensdauer überschreitet:

200k

Hervorheben:

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Zahlungs-u. Verschiffen-Ausdrücke

Min Bestellmenge

3000pcs

Preis

999

Verpackung Informationen

Neutrienverpackung oder mit OEM -Logo

Lieferzeit

5-8 Werktage

Zahlungsbedingungen

L/C, Western Union, T/T

Versorgungsmaterial-Fähigkeit

100000 Rollen pro Monat

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Produkt-Beschreibung

High Quality Switch Contact Pin Test Probe YF DE1-051DF57-01C0

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.

Key Product Features

High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Umbauten：

Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

High Quality Brass Spring Loaded 4 Pin PCB Contact Pin for Electronic Device

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for PCB Testing

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for IC Testing

Elektrotechnik mit vergoldetem Wolframdraht

0.01mm Wolframdraht FuE

Elektronik aus vergoldetem Molybdändraht