Name: Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

Haus > produits > Frühlingstestsonden >

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Herkunftsort:

China

Markenname:

WINNER

Zertifizierung:

ISO9100

Treten Sie mit uns in Verbindung

Fordern Sie ein Zitat

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Produktdetails

Produktname:

Probe für die Federprüfung

Fass:

PB, vergoldet

Unterer Kolben:

BeCu/SK4, vergoldet

TOP-Kolben:

Pd-Legierung/nicht plattiert

FRÜHLING:

SWPB(SUS)/vergoldet

Verfügbarkeit:

Benutzerdefinierte Größen verfügbar

Beschichtung:

Vergoldet

Aktuelle Bewertung:

Kontaktwiderstand:

100 Mohm max

Bandbreite:

-0,17 dB bei 19,6 GHz

Induktivität:

1,25 nH

Kapitän:

1,61 pF

Voller Hub:

1,00 mm

Nennschlag:

0,65 mm

Federkraft:

30 Gramm bei Ø 65 mm

Mechanische Lebensdauer überschreitet:

200k

Hervorheben:

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Zahlungs-u. Verschiffen-Ausdrücke

Min Bestellmenge

3000pcs

Preis

999

Verpackung Informationen

Neutrienverpackung oder mit OEM -Logo

Lieferzeit

5-8 Werktage

Zahlungsbedingungen

L/C, Western Union, T/T

Versorgungsmaterial-Fähigkeit

100000 Rollen pro Monat

Verwandte Produkte

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Erhalten Sie besten Preis

China Supplier ICT test probe P048

Erhalten Sie besten Preis

CHINA Supply YF-100 Brass Material Spring Contact Probe Pin

Erhalten Sie besten Preis

Fabrikdirekter Preis Federprüfstifte

Erhalten Sie besten Preis

Treten Sie mit uns in Verbindung

Kontakt jetzt

Produkt-Beschreibung

High Efficiency BGA Testing Probes

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.

Key Product Features

Ultra-Fine Precision: 0.11 mm plunger and 0.15 mm barrel for micro-pitch PCB pads, IC leads, flex circuits, and semiconductor testing
High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Production Specifications

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Umbauten：

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

China Supplier ICT test probe P048

CHINA Supply YF-100 Brass Material Spring Contact Probe Pin

Fabrikdirekter Preis Federprüfstifte

Elektrotechnik mit vergoldetem Wolframdraht

0.01mm Wolframdraht FuE

Elektronik aus vergoldetem Molybdändraht