P75-E2 Spring Test Probe with 1.3mm Conical Head and 1.02mm Tube Diameter for 3A PCB Testing

E-type conical head probe designed for PCB testing applications. An excellent replacement option to extend the life of your test station.

• Precision conical head design: Head Diameter 1.3mm, Tube Diameter 1.02mm
• Durable construction: Shank Diameter 0.74mm, Length 16.5mm
• Optimal performance: Minimum Test Distance 1.91mm, Full Stroke 2.50mm
• Reliable electrical characteristics: Spring Pressure 100g, Current 3A, Resistance 50m Ohm
• Premium materials: Heat treated beryllium copper plunger with gold plated phosphor bronze barrel and gold plated stainless steel wire spring
• Essential for PCB conductive testing to evaluate components on printed circuit assemblies
• Ideal for testing through-hole components, gold fingers (edge connectors), and welding pads

Test probes are available from many manufacturers with similar constraints. When selecting a test probe receptacle, the tip choice is the most critical consideration.

Detailed illustration of test probe components and construction

Various test probe tip types

At SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD., we offer comprehensive customization:

• Custom diameters to match your specific requirements
• Custom plating thicknesses for optimal conductivity and durability
• Custom mechanical specifications tailored to your application

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment